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Proposal for common data transfer format for simulation softwares used in surface electron spectroscopies
Author(s) -
Yoshikawa Hideki,
Yoshihara Kazuhiro,
Watanabe Daisuke,
Tanaka Hiromi,
Tanuma Shigeo
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5390
Subject(s) - x ray photoelectron spectroscopy , auger electron spectroscopy , electron spectroscopy , nanostructure , computer science , electron transfer , spectroscopy , electron , materials science , analytical chemistry (journal) , chemistry , nanotechnology , physics , nuclear magnetic resonance , quantum mechanics , chromatography , nuclear physics
The electron spectroscopies, X‐ray photoelectron spectroscopy, Auger electron spectroscopy, and so on have been used for surface chemical analysis of nanostructured specimens. Simulation softwares comparing a simulated electron spectrum with an experimental one have played an important role in revealing the layered nanostructure of specimens, and the widespread use of the simulation softwares, therefore, boosts the commonly accepted capability of the analysis with the electron spectroscopies to a higher level. This report proposes an XML data format for effectively describing simulated results so that the format can promote discussing the results and storing them in a database that helps a user to master the simulation softwares. Copyright © 2014 John Wiley & Sons, Ltd.