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Investigation of silica nanoparticles by Auger electron spectroscopy (AES)
Author(s) -
Rades S.,
Wirth T.,
Unger W.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5378
Subject(s) - auger electron spectroscopy , nanomaterials , spectroscopy , auger , nanoparticle , electron spectroscopy , materials science , line (geometry) , inductively coupled plasma atomic emission spectroscopy , analytical chemistry (journal) , nanotechnology , chemistry , physics , atomic physics , nuclear physics , inductively coupled plasma , environmental chemistry , mathematics , geometry , plasma , quantum mechanics
High‐priority industrial nanomaterials like SiO 2 , TiO 2, and Ag are being characterized on a systematic basis within the framework of the EU FP7 research project NanoValid . Silica nanoparticles from an industrial source have been analyzed by Auger electron spectroscopy. Point, line, and map spectra were collected. Material specific and methodological aspects causing the special course of Auger line scan signals will be discussed. Copyright © 2014 John Wiley & Sons, Ltd.