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Data and device protection: A ToF‐SIMS, wetting, and XPS study of an Apple iPod nano
Author(s) -
Gupta Vipul,
Tuscano Joshua A.,
Romriell Naomi R.,
Davis Robert C.,
Linford Matthew R.
Publication year - 2014
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5352
Subject(s) - wetting , x ray photoelectron spectroscopy , touchscreen , materials science , contact angle , nano , polymer , secondary ion mass spectrometry , coating , nanotechnology , hexadecane , chemical engineering , chemistry , computer science , mass spectrometry , composite material , organic chemistry , chromatography , engineering , operating system
An important aspect of the robustness of an electronic device is its ability to resist water, fingerprints, dirt, and smudges that may compromise its ability to function and/or the information within it. Here, we report a chemical analysis by ToF‐SIMS, wetting, and XPS of the surfaces in a commercially available Apple iPod nano (8GB, MC525LL/A), which showed good resistance to its environment. This analysis reveals that the front panel (touchscreen) of the device is coated with a low free energy fluorinated polymer that may consist of short segments of a fluorinated hydrocarbon connected through ether linkages. No other part of the device appears to have this hydrophobic coating. A plasma treatment of the device leads to a deterioration of its performance. This work demonstrates how different analytical techniques can complement each other and contribute to a better understanding of a surface or a material. Copyright © 2013 John Wiley & Sons, Ltd.