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Estimation of useful yields for electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS)
Author(s) -
Hiraoka Kenzo,
Asakawa Daiki,
Takaishi Rio
Publication year - 2013
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5191
Subject(s) - chemistry , desorption , electrospray , ion , mass spectrometry , analytical chemistry (journal) , rhodamine , ionic bonding , yield (engineering) , rhodamine b , chromatography , adsorption , materials science , organic chemistry , physics , quantum mechanics , photocatalysis , metallurgy , fluorescence , catalysis
Useful yield for electrospray droplet impact/secondary ion mass spectrometry was estimated. The mixtures of C 60 /rhodamine B and C 60 /Aerosol OT were used as the samples for the positive and negative mode of operations, respectively. By assuming that (i) the desorption efficiencies are about the same for C 60 , rhodamine B and Aerosol OT, and (ii) desorption of ionic compounds directly gives the secondary ion signals, the useful yields (i.e. total ions generated divided by the total molecules desorbed) for C 60 were estimated to be ~0.1. This value should be regarded as the upper limit because the neutralization of positive and negative ions in the plume and desorption of ionic compounds as neutral species are not taken into account. Copyright © 2012 John Wiley & Sons, Ltd.