Origin of differences between MCs +  and MCs 2  +  SIMS depth profiles | Zendy

Miyamoto Takashi | Zendy; Numao Shigenori | Zendy; Hasegawa Takahiro | Zendy; Karen Akiya | Zendy

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Origin of differences between MCs + and MCs 2 + SIMS depth profiles

Author(s) -

Miyamoto Takashi,

Numao Shigenori,

Hasegawa Takahiro,

Karen Akiya

Publication year - 2013

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.5163

Subject(s) - electronegativity , analytical chemistry (journal) , chemistry , ion , secondary ion mass spectrometry , matrix (chemical analysis) , mass spectrometry , atomic physics , radiochemistry , physics , chromatography , organic chemistry

For secondary ion mass spectrometry of highly electronegative elements, the MCs 2 + method provides greater sensitivity but may sometimes afford a different depth profile than the conventional MCs + method for the same sample. Here, we report the difference system not only from the electronegativity of the elements but also from the electronegativity of the matrix. Copyright © 2012 John Wiley & Sons, Ltd.

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