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Characterization of organic solar cell materials by G‐SIMS
Author(s) -
Franquet A.,
Conard T.,
Voroshazi E.,
Poleunis C.,
Cheyns D.,
Vandervorst W.
Publication year - 2013
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5128
Subject(s) - characterization (materials science) , secondary ion mass spectrometry , static secondary ion mass spectrometry , ion , monatomic gas , cluster (spacecraft) , chemistry , solar cell , analytical chemistry (journal) , materials science , nanotechnology , optoelectronics , environmental chemistry , organic chemistry , computer science , programming language
In this study, the gentle SIMS (G‐SIMS) method has been applied to organic solar cell materials. Various primary ion conditions were used to generate the G‐SIMS spectra; monoatomic and cluster sources with different energies were tested. It is shown that the G‐SIMS concept helps to identify both PCBM and P3HT materials through the enhancement of molecular and characteristic ions of the two molecules. Copyright © 2012 John Wiley & Sons, Ltd.