Significant change in water contact angle of electrospray‐synthesized SiO 2  films depending on their surface morphology | Zendy

Kim EunKyeong | Zendy; Kim JiYeong | Zendy; Kim Sang Sub | Zendy

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Significant change in water contact angle of electrospray‐synthesized SiO 2 films depending on their surface morphology

Author(s) -

Kim EunKyeong,

Kim JiYeong,

Kim Sang Sub

Publication year - 2013

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.5112

Subject(s) - contact angle , morphology (biology) , electrospray , amorphous solid , materials science , chemical engineering , chemistry , crystallography , composite material , mass spectrometry , chromatography , geology , paleontology , engineering

Amorphous SiO 2 films were deposited by means of an electrospray technique. The relation between the water contact angle (WCA) of the deposited SiO 2 films and the surface morphology is investigated. The feeding rate of the electrospray process greatly affects the morphology of the synthesized SiO 2 films. There is also a significant change in the WCA on the surface of the films: the rougher the surface, the greater the WCA. A model based on the Cassie–Baxter formulation is used to explain the change observed in the WCA on the SiO 2 films. Copyright © 2012 John Wiley & Sons, Ltd.

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