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Characterization of individual nano‐objects with nanoprojectile‐SIMS
Author(s) -
Liang C.K.,
Verkhoturov S. V.,
Bisrat Y.,
Dikler S.,
DeBord J. D.,
FernandezLima F. A.,
Schweikert E. A.,
DellaNegra S.
Publication year - 2013
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5084
Subject(s) - nano , characterization (materials science) , substrate (aquarium) , scanning electron microscope , mass spectrometry , secondary ion mass spectrometry , ion , deposition (geology) , analytical chemistry (journal) , nanotechnology , ionization , materials science , secondary electrons , chemistry , electron , chromatography , physics , geology , composite material , paleontology , oceanography , organic chemistry , sediment , quantum mechanics
Secondary ion mass spectrometry (SIMS) applied in the event‐by‐event bombardment/detection mode is uniquely suited for the characterization of individual nano‐objects. In this approach, nano‐objects are examined one‐by‐one, allowing for the detection of variations in composition. The validity of the analysis depends upon the ability to physically isolate the nano‐objects on a chemically inert support. This requirement can be realized by deposition of the nano‐objects on a Nano‐Assisted Laser Desorption/Ionization (NALDI™) plate. The featured nanostructured surface provides a support where nano‐objects can be isolated if the deposition is performed at a proper concentration. We demonstrate the characterization of individual nano‐objects on a NALDI™ plate for two different types of nanometric bacteriophages: Qβ and M13. Scanning electron microscope (SEM) images verified that the integrity of the phages is preserved on the NALDI™ substrate. Mass spectrometric data show secondary ions from the phages are identified and resolved from those from the underlying substrate. Copyright © 2012 John Wiley & Sons, Ltd.