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18 O distributions in porous anodic alumina by plasma profiling time‐of‐flight mass spectrometry and nuclear reaction analysis
Author(s) -
Baron Wiecheć A.,
Tempez A.,
Skeldon P.,
Chapon P.,
Thompson G. E.
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5032
Subject(s) - nuclear reaction analysis , chemistry , mass spectrometry , analytical chemistry (journal) , tracer , time of flight , secondary ion mass spectrometry , accelerator mass spectrometry , phosphoric acid , time of flight mass spectrometry , porosity , ion , chromatography , ionization , physics , organic chemistry , nuclear physics
A comparison is made between plasma profiling time‐of‐flight mass spectrometry (PP‐TOFMS) and nuclear reaction analysis (NRA) for depth profiling of 18 O tracer in porous anodic oxide films on aluminum. The films were formed galvanostatically, for a range of times, using phosphoric acid electrolytes that were either enriched in 18 O or of the natural isotopic concentration. The morphologies of the films were determined by electron microscopy. The findings from PP‐TOFMS and NRA reveal a partitioning of the tracer between the surface regions and buried layers of the films. However, a relatively high background of 16 O in PP‐TOFMS prevents a reliable quantification of the concentration of 18 O. Copyright © 2012 John Wiley & Sons, Ltd.