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Nuclear safeguards applications using LG‐SIMS with automated screening capabilities
Author(s) -
Peres P.,
Hedberg P. M. L.,
Walton S.,
Montgomery N.,
Cliff J. B.,
Rabemananjara F.,
Schuhmacher M.
Publication year - 2013
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.5015
Subject(s) - secondary ion mass spectrometry , uranium , microbeam , particle (ecology) , mass spectrometry , nuclear material , analytical chemistry (journal) , materials science , characterization (materials science) , chemistry , nuclear physics , nanotechnology , metallurgy , physics , nuclear chemistry , chromatography , oceanography , geology
A primary tool for detecting undeclared nuclear activities is the analysis of uranium‐bearing particles collected on cotton swipes. For many years, secondary ion mass spectrometry (SIMS) has been used as one of the mainstay techniques for particle analysis of nuclear safeguards samples. SIMS is unique in that it is the only technique that can both localize the particles of interest and also provide the isotopic composition of single particles. This paper presents data obtained on standard uranium particle samples using large geometry (LG)‐SIMS instruments equipped with the newly developed, automated particle measurement screening software. Both sample screening measurements and microbeam analyses on individual particles are presented. The enhanced performance of the SIMS method for nuclear safeguards applications using LG‐SIMS instruments equipped with automated screening capabilities is also discussed. Copyright © 2012 John Wiley & Sons, Ltd. and Crown copyright