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Application of surface analysis methods to nanomaterials: summary of ISO/TC 201 technical report: ISO 14187:2011 – surface chemical analysis – characterization of nanomaterials
Author(s) -
Baer D. R.
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4938
Subject(s) - nanomaterials , characterization (materials science) , nanotechnology , x ray photoelectron spectroscopy , materials science , auger electron spectroscopy , secondary ion mass spectrometry , nanometre , nanoparticle , mass spectrometry , analytical chemistry (journal) , chemistry , chemical engineering , physics , engineering , environmental chemistry , chromatography , composite material , nuclear physics
The ISO technical report 14187 provides an introduction to (and examples of) the information that can be obtained about nanostructured materials by using surface analysis tools. In addition, both general issues and challenges associated with characterizing nanostructured materials and the specific opportunities and challenges associated with individual analytical methods are identified. As the size of objects or components of materials approaches a few nanometers, the distinctions among ‘bulk’, ‘surface’, and ‘particle’ analysis blur. This technical report focuses on issues specifically relevant to surface chemical analysis of nanostructured materials. The report considers a variety of analysis methods but focuses on techniques that are in the domain of ISO/TC 201 including Auger electron spectroscopy, X‐ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning probe microscopy. Measurements of nanoparticle surface properties such as surface potential that are often made in a solution are not discussed. Copyright © 2012 John Wiley & Sons, Ltd.