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X‐ray photoelectron spectroscopy: surface and depth profiling studies of glasses doped with Nd and Yb ions
Author(s) -
RiveraLópez F.,
Pérez Mariano
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4921
Subject(s) - x ray photoelectron spectroscopy , valence (chemistry) , doping , analytical chemistry (journal) , dopant , luminescence , ion , materials science , chemical state , chemistry , nuclear magnetic resonance , optoelectronics , physics , organic chemistry , chromatography
In this work, a chemical characterization of phosphate glasses doped with Nd and Yb ions by means of high‐resolution X‐ray photoelectron spectroscopy (XPS) is presented. The results obtained are correlated with both the infrared absorption and luminescence spectra after laser excitation. One of the important goals of this work is to obtain information about the rare‐earth dopant distribution in the glass. In this sense, valuable information is obtained by high‐resolution XPS depth profiling, in order to study the uniform/non‐uniform distribution of precursor element concentrations from the surface to deeper zones. When this Nd‐Yb co‐doped glass system is considered as a potential laser device, the distribution of precursor elements can affect the rare‐earth optical output luminescence properties depending on the focused pumping point. In addition, the XPS technique also permitted a chemical characterization of the glasses both in surface and volume, giving information about the valence state of the rare‐earth ions in these glasses and the vibrational properties. Copyright © 2012 John Wiley & Sons, Ltd.