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Quantitative grain boundary analysis of bulk samples by SIMS
Author(s) -
Christien F.,
Downing C.,
Moore K. L.,
Grovenor C. R. M.
Publication year - 2013
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4884
Subject(s) - grain boundary , auger , secondary ion mass spectroscopy , materials science , auger electron spectroscopy , secondary ion mass spectrometry , high resolution , metallurgy , analytical chemistry (journal) , mineralogy , chemistry , mass spectrometry , geology , physics , atomic physics , microstructure , remote sensing , chromatography , silicon , nuclear physics
Solute grain boundary (GB) segregation is an important metallurgical phenomenon that has been extensively studied over the last 40 years, especially by Auger spectroscopy of fractured surfaces. More recently, it has been demonstrated that high‐resolution SIMS (NanoSIMS) analysis can detect solute GB segregation on a simple polished cross‐section. The aim of the work presented here was to demonstrate the use of SIMS to achieve quantitative analysis of GB segregation, including taking into account the inclination of the individual boundaries to the bulk sample surface. Copyright © 2012 John Wiley & Sons, Ltd.