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Summary of ISO/TC 201 Standard: ISO 18115‐1:2010 – surface chemical analysis – vocabulary – general terms and terms used in spectroscopy
Author(s) -
Seah M P
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4877
Subject(s) - x ray photoelectron spectroscopy , spectroscopy , auger electron spectroscopy , analytical chemistry (journal) , electron spectroscopy , chemistry , instrumental chemistry , mass spectrometry , physics , nuclear magnetic resonance , time resolved spectroscopy , quantum mechanics , chromatography , nuclear physics
This International Standard revises ISO 18115:2001 and the two subsequent amendments by bringing the material up to date and separating out the general terms and terms used in spectroscopy into Part 1, and terms relating to scanning probe microscopy into Part 2. This part, Part 1, covers 548 terms used in Auger electron spectroscopy, elastic peak electron spectroscopy, reflected electron energy loss spectroscopy, secondary ion mass spectrometry, ultra‐violet photoelectron spectroscopy, X‐ray photoelectron spectroscopy, and so on, as well as 52 acronyms. The terms cover words or phrases used in describing the samples, instruments, and theoretical concepts involved in surface chemical analysis. Copyright © 2012 Crown copyright.