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Comparison between surface excitation parameter obtained from QUEELS and SESINIPAC
Author(s) -
Pauly N.,
Novák M.,
Dubus A.,
Tougaard S.
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4829
Subject(s) - inelastic mean free path , excitation , electron energy loss spectroscopy , mean free path , electron , atomic physics , semiconductor , electron excitation , chemistry , excitation function , dispersion (optics) , computational physics , physics , optics , quantum mechanics
Surface excitations significantly influence the measured peak intensities in elastic peak electron spectroscopy. They are characterised by the surface excitation parameter (SEP) defined as the change in excitation probability of an electron caused by the presence of the surface in comparison with an electron moving in an infinite medium. It is thus important to have a large database of SEP values or to have the possibility to determine it with a user‐friendly software. Recently, Novák developed the programme Software for Electron Solid Inelastic Interaction Parameter Calculations (SESINIPAC) within the model of Tung, Chen, Kwei and Chou, which allows to determine inelastic mean free path, differential inelastic mean free path, SEP and differential SEP for various energy loss function models and dispersion relations with as only input the energy loss function of the material. Using SESINIPAC, we calculate SEP for 27 different types of materials (metals, semiconductors and insulators) and for various angles and energies. We compare these results with those obtained previously with the software Quantitative Analysis of Electron Energy Losses at Surfaces (QUEELS), which uses the Yubero‐Tougaard model. We show that the dependence on angle of emission and energy is quite similar for the two models. However, the absolute values calculated with SESINIPAC are generally larger than those calculated with QUEELS, and the mean relative difference is 20% for metals and semiconductors but exceeds 50% for insulators. Copyright © 2012 John Wiley & Sons, Ltd.