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Domain structures of single layer graphene imaged with conductive probe atomic force microscopy
Author(s) -
Kwon Sangku,
Chung H. J.,
Seo Sunae,
Park Jeong Young
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.4810
Subject(s) - graphene , materials science , conductive atomic force microscopy , chemical vapor deposition , conductance , layer (electronics) , substrate (aquarium) , nanoscopic scale , condensed matter physics , graphene nanoribbons , nanotechnology , chemical physics , atomic force microscopy , chemistry , physics , oceanography , geology
We report nanoscale domain boundaries on single layer graphene probed with conductive probe atomic force microscopy in ultrahigh vacuum. Graphene was prepared using the inductively coupled plasma chemical vapor deposition technique on a copper substrate. Current mapping revealed domains 50–100 nm in size on the single layer graphene. Stick slip images revealed a hexagonal structure of the graphene layer in the middle of the domain. The conductance on the domain boundary is lower than that inside the domain structure, which is associated with disorder on the boundary, while friction and adhesion measurements on the domain boundaries did not show any contrast. We found that the conductance contrast is prominent at high loads, suggesting the domain boundary plays a significant role in the charge transport properties of graphene under mechanical deformation. Copyright © 2012 John Wiley & Sons, Ltd.