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Surface roughness, waviness, and shape induced effects in angle‐resolved XPS
Author(s) -
Bianchi D.,
Katona L.,
Brenner J.,
Vorlaufer G.,
Vernes A.,
Werner W. S. M.,
Betz G.
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3858
Subject(s) - waviness , pointwise , x ray photoelectron spectroscopy , surface finish , surface roughness , surface (topology) , materials science , optics , wavelet , geometry , physics , mathematical analysis , mathematics , composite material , computer science , artificial intelligence , nuclear magnetic resonance
The experimentally determined topographies of engineering surfaces are decomposed using multiresolution analysis to better understand the impact of surface roughness on angle‐resolved XPS. Multiresolution analysis is a powerful mathematical tool based on wavelets, which allows one to unambiguously distinguish between the roughness, waviness, and shape of any engineering surface. Exploiting exactly these features, here the separate effects of roughness, waviness, and shape on angle‐resolved XPS are computationally investigated in the case of some engineering surfaces by locally (almost pointwise) applying the Beer–Lambert law at various levels of resolution. Copyright © 2011 John Wiley & Sons, Ltd.