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Epoxy‐functionalized surfaces for microarray applications: surface chemical analysis and fluorescence labeling of surface species
Author(s) -
Funk Christian,
Dietrich Paul M.,
Gross Thomas,
Min Hyegeun,
Unger Wolfgang E. S.,
Weigel Wilfried
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3856
Subject(s) - silanization , epoxy , fluorescence , rhodamine , mass spectrometry , surface modification , x ray photoelectron spectroscopy , secondary ion mass spectrometry , contact angle , analytical chemistry (journal) , chemistry , materials science , fluorescence spectrometry , chemical engineering , chromatography , composite material , organic chemistry , optics , physics , engineering
Methods for characterization of epoxy‐functionalized substrates used for microarray applications, prepared by silanization with 3‐glycidoxypropyltrimethoxysilane, have been developed. Contact angle measurements, X‐ray photoelectron spectroscopy, time of flight secondary ion mass spectrometry and fluorescence based methods have been applied to investigate these epoxy‐functionalized microarray substrates. The surface density of epoxy‐functionalized glass slides was investigated by fluorescence labeling of surface species utilizing Rhodamine 110 as fluorescence probe. Copyright © 2011 John Wiley & Sons, Ltd.