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Modeling of PEG grafting and prediction of interfacial force profile using X‐ray photoelectron spectroscopy
Author(s) -
Damodaran Vinod B.,
Fee Conan J.,
Popat Ketul C.
Publication year - 2012
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3783
Subject(s) - x ray photoelectron spectroscopy , peg ratio , ethylene glycol , grafting , chemistry , langmuir , amine gas treating , chemical engineering , analytical chemistry (journal) , materials science , adsorption , chromatography , polymer , organic chemistry , engineering , finance , economics
Poly(ethylene glycol) (PEG)‐grafted Sephadex™ derivatives were prepared by a covalent amine conjugation method and characterized using XPS. PEG‐grafting kinetics were studied using both Langmuir and Langmuir–Freundlich isotherm models by correlating fractional CO intensities obtained from high‐resolution C 1s scans with the grafting period. Theoretical values were compared with experimental results to confirm the reliability of the modeling predictions. Detailed surface characterization of PEG‐grafted Sephadex derivatives was performed using XPS data, and the results were used to predict the interaction free energy and stick force exerted at the matrix interface. Copyright © 2011 John Wiley & Sons, Ltd.