Premium
Surface analysis of high performance carbon/bismaleimide composites exposed to electron irradiation
Author(s) -
Yu Qi,
Chen Ping,
Gao Yu,
Liu Dong,
Mu Jujie
Publication year - 2011
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3756
Subject(s) - fluence , irradiation , x ray photoelectron spectroscopy , surface roughness , materials science , composite material , scanning electron microscope , carbon fibers , surface layer , layer (electronics) , surface finish , morphology (biology) , electron beam processing , chemical composition , surface modification , chemical engineering , chemistry , composite number , organic chemistry , physics , biology , nuclear physics , engineering , genetics
The aim of this article was to investigate the effects of electron irradiation in ultrahigh vacuum environment on the surface properties of high‐performance carbon/bismaleimide (BMI) composites used in aerospace. The changes in surface chemical composition with increasing irradiation fluence were studied by XPS. The evolution of surface morphology and surface roughness were observed by atomic force microscopy (AFM). The mass loss behavior occurring in the surface layer of the composites was examined. The results indicated that the electron irradiation in high vacuum caused rupture of chemical bonds and cross‐linking process in the surface layer, thereby leading to the mass loss behavior and the formation of carbonification layer in the surface of the carbon/BMI composites. The changes in the surface chemical composition were determined by a competing effect existing between the rupture of chemical bonds and the cross‐linking process at lower irradiation fluence, and by a degradation process only at higher fluence of electron irradiation. The surface morphology was altered and the surface roughness was increased significantly after electron irradiation. The mass loss ratio first increased obviously at lower fluences, and then reached a plateau value of 0.45% beyond 5 × 10 15 cm −2 fluence of electron irradiation. Copyright © 2011 John Wiley & Sons, Ltd.