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Summary of ISO/TC 201 Standard: ISO 29081: 2010, surface chemical analysis—Auger electron spectroscopy—reporting of methods used for charge control and charge correction
Author(s) -
Baer D. R.
Publication year - 2011
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3724
Subject(s) - auger electron spectroscopy , x ray photoelectron spectroscopy , charge (physics) , charge control , electron spectroscopy , analytical chemistry (journal) , auger , electron , chemistry , atomic physics , materials science , physics , nuclear magnetic resonance , thermodynamics , nuclear physics , quantum mechanics , power (physics) , battery (electricity) , chromatography
This international standard specifies the minimum amount of information required for describing the methods of charge control and charge correction in measurements of Auger electron transitions from insulating specimens by electron‐stimulated AES to be reported with the analytical results. Information is provided in an Annex on methods that have been found useful for charge control prior to or during AES analysis. The Annex also includes a summary table of methods or approaches, ordered by simplicity of approach. A similar international standard has been published for XPS (ISO 19318: 2003(E), Surface chemical analysis—XPS—reporting of methods used for charge control and charge correction. Copyright © 2010 John Wiley & Sons, Ltd.