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Experimental and numerical analysis of sum frequency microscopic images of a H‐Si(111) 1 × 1 surface after IR light pulse irradiation
Author(s) -
Miyauchi Y.,
Sano H.,
Okada J.,
Yamashita H.,
Mizutani G.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3605
Subject(s) - irradiation , pulse (music) , laser , desorption , chemistry , hydrogen , analytical chemistry (journal) , infrared , signal (programming language) , optics , materials science , atomic physics , physics , adsorption , organic chemistry , chromatography , detector , computer science , nuclear physics , programming language
In this study, we have observed sum frequency (SF) images of a HSi(111) surface after IR light irradiation of pulse width ∼6 µs, and power from 11 to 13 mJ/pulse. After the IR light pulse irradiation, nonresonant SF signals appeared in the irradiated area. The width of the area emitting the nonresonant SF signal was sensitive to the power of IR light pulses. We compared the profile of the SF signal with that of the calculated hydrogen deficiency by using laser‐induced thermal desorption (LITD) model. The profiles of the calculated hydrogen deficiency were consistent with those of the observed nonresonant SF signal qualitatively. Copyright © 2010 John Wiley & Sons, Ltd.