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Energy‐dependent fragmentation of polystyrene molecule using size‐selected Ar gas cluster ion beam projectile
Author(s) -
Moritani Kousuke,
Mukai Gen,
Hashinokuchi Michihiro,
Mochiji Kozo
Publication year - 2011
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3551
Subject(s) - ion , atomic physics , kinetic energy , projectile , chemistry , dissociation (chemistry) , bond dissociation energy , fragmentation (computing) , atom (system on chip) , cluster (spacecraft) , molecule , polystyrene , analytical chemistry (journal) , materials science , physics , polymer , organic chemistry , quantum mechanics , computer science , programming language , chromatography , metallurgy , embedded system , operating system
A size‐selected Ar gas cluster ion beam (GCIB) was applied to the SIMS of a polystyrene thin film. The size of Ar cluster ions are selected between 5000 to 500 atoms at an acceleration voltage of 5 and 10 kV using time‐of‐flight technique. Under this condition, the kinetic energy per constituent atom ( E atom ) of the GCIB projectile was estimated to be 1 ∼ 20 eV. The E atom dependence of secondary ion yield of fragment species of polystyrene can be essentially classified into three types which are attributable to the relationship between the E atom and the dissociation energy of the specified bonding site of the molecule. These results indicate that the site‐specific bond breaking of molecules could be possible by adjusting the E atom of size‐selected GCIB. Copyright © 2010 John Wiley & Sons, Ltd.
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