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A molecular dynamics study of a 5 keV C 60 fullerene impact on a two‐component organic molecular sample
Author(s) -
Ponomarev M. G.,
Garrison B. J.,
Vickerman J. C.,
Webb R. P.
Publication year - 2011
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3527
Subject(s) - fullerene , molecule , benzene , chemistry , matrix (chemical analysis) , endohedral fullerene , molecular dynamics , chemical physics , ion , projectile , analytical chemistry (journal) , desorption , polyatomic ion , mass spectrometry , atomic physics , materials science , computational chemistry , organic chemistry , physics , adsorption , chromatography , metallurgy
A study has been made to explore impact‐induced desorption of C 60 fullerenes embedded in a benzene matrix as a model of matrix assisted secondary ion mass spectrometry. A fullerene concentration of about 0.5% was incorporated in a coarse‐grained benzene target and then struck by a 5 keV fullerene projectile. The response of the benzene target was compared with a pure benzene target to observe the effects of the embedded molecules on the matrix. Three different trajectories were investigated. In the first, a single sputtered fullerene was ejected joined to a carbon atom from the projectile. In the second, an undamaged C 60 was ejected, and in the third, no intact fullerenes were ejected. In all three cases, 4–6 fullerenes were pushed above the initial surface but were relocated into the crater rim, enriching the surface layer with the heavier and more strongly bound component. It is observed that the sputtered fullerenes are ejected with a number of matrix molecules, and that there is a small decrease in the internal energy of the ejected fullerene that corresponds to the gradual separation of the surrounding matrix molecules from the larger molecule. This evaporative cooling may provide a potential benefit to Matrix Assisted SIMS. Copyright © 2010 John Wiley & Sons, Ltd.