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Au adsorption on defect‐rich MgO(100) surfaces
Author(s) -
Socha Robert P.,
Zackiewicz Ewa,
Spiridis Nika,
Korecki Józef
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3472
Subject(s) - x ray photoelectron spectroscopy , auger , adsorption , substrate (aquarium) , deposition (geology) , binding energy , monolayer , analytical chemistry (journal) , range (aeronautics) , excitation , chemistry , materials science , crystallography , nanotechnology , atomic physics , chemical engineering , composite material , environmental chemistry , physics , paleontology , oceanography , sediment , engineering , biology , geology , quantum mechanics
The XPS technique was applied to study Au deposition on defect‐rich MgO(100) surfaces in a coverage range of 0.2–5 Au monolayers. Three MgO surfaces were used with increasing concentration of surface defects as determined based on surface composition and modified Auger parameter: air‐cleaved, ultrahigh‐vacuum‐cleaved, and polished. The analysis of the Au 4f core excitation intensities showed 3D‐island growth of Au. The Au 4f binding energy was shown to decrease with increasing Au coverage, with a dependence on the substrate type. Copyright © 2010 John Wiley & Sons, Ltd.
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