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Routine TOF‐SIMS instrument control using polycarbonate material
Author(s) -
Fartmann Michael,
Kersting Reinhard,
Hagenhoff Birgit
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3460
Subject(s) - polycarbonate , analytical chemistry (journal) , characterization (materials science) , time of flight , materials science , chemistry , composite material , nanotechnology , chromatography
We suggest the use of polycarbonate as reference material for the routine time of flight (TOF) SIMS (TOF‐SIMS) instrument control under quality management regulations (e.g. ISO/IEC 17025:2005). By monitoring an easy‐to‐determine relative peak area ratio, the performance of TOF‐SIMS instruments can well be assessed, in particular, with respect to the characterization of insulating samples. Copyright © 2010 John Wiley & Sons, Ltd.