Routine TOF‐SIMS instrument control using polycarbonate material | Zendy

Fartmann Michael | Zendy; Kersting Reinhard | Zendy; Hagenhoff Birgit | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Routine TOF‐SIMS instrument control using polycarbonate material

Author(s) -

Fartmann Michael,

Kersting Reinhard,

Hagenhoff Birgit

Publication year - 2010

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.3460

Subject(s) - polycarbonate , analytical chemistry (journal) , characterization (materials science) , time of flight , materials science , chemistry , composite material , nanotechnology , chromatography

We suggest the use of polycarbonate as reference material for the routine time of flight (TOF) SIMS (TOF‐SIMS) instrument control under quality management regulations (e.g. ISO/IEC 17025:2005). By monitoring an easy‐to‐determine relative peak area ratio, the performance of TOF‐SIMS instruments can well be assessed, in particular, with respect to the characterization of insulating samples. Copyright © 2010 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research