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Characterization and quantification of biological micropatterns using cluster SIMS
Author(s) -
Chen LiJung,
Shah Sunny S.,
Verkhoturov Stanislav V.,
Revzin Alexander,
Schweikert Emile A.
Publication year - 2011
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3399
Subject(s) - micropatterning , nanotechnology , photoresist , characterization (materials science) , secondary ion mass spectrometry , silane , polydimethylsiloxane , ethylene glycol , materials science , biosensor , mass spectrometry , lithography , chemistry , chromatography , optoelectronics , organic chemistry , layer (electronics) , composite material
Micropatterning is used widely in biosensor development, tissue engineering and basic biology. Creation of biological micropatterns typically involves multiple sequential steps which may lead to cross‐contamination and contribute to suboptimal performance of the surface. Therefore, there is a need to develop novel strategies for characterizing location‐specific chemical composition of biological micropatterns. In this paper, C 60 + time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) operating in the event‐by‐event bombardment/detection mode was used for spatially resolved chemical analysis of micropatterned indium tin oxide (ITO) surfaces. Fabrication of the micropatterns involved multiple steps including self‐assembly of poly(ethylene glycol)‐silane (PEG‐silane), patterning of photoresist, treatment with oxygen plasma and adsorption of collagen (I). The ITO surfaces were analyzed with 26‐keV C 60 + SIMS run in the event‐by‐event bombardment/detection mode at different steps of the modification process. We were able to evaluate the extent of cross‐contamination between different steps and quantify coverage of the immobilized species. The methodology described here provides a novel means for characterizing the composition of biological micropatterns in a quantitative and spatially resolved manner. Copyright © 2010 John Wiley & Sons, Ltd.