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Investigation of 1‐butyl‐3‐methylimidazolium bis(trifluoromethylsulfonyl)imide under Bi n x+ cluster ion bombardment
Author(s) -
Holzweber Markus,
Hutter Herbert
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3379
Subject(s) - ion , imide , chemistry , mass spectrum , cluster (spacecraft) , bismuth , secondary ion mass spectrometry , mass spectrometry , analytical chemistry (journal) , static secondary ion mass spectrometry , yield (engineering) , fragmentation (computing) , fast atom bombardment , materials science , polymer chemistry , organic chemistry , chromatography , operating system , computer science , metallurgy , programming language
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was used to study 1‐butyl‐3‐methylimidazolium bis(tri‐ fluoromethylsulfonyl)imide under Bi‐ion and Bi‐cluster‐ion (Bi 2–7 + , Bi 3, 5, 7 ++ ) bombardment in positive and negative polarity. Peak pattern as well as practical experiences with the bismuth cluster LMIG is discussed. Mass spectra with the best mass resolution were obtained using Bi 3 ++ or Bi 5 ++ as primary ion source. The secondary ion yield of high molecular ion is enhanced up to two orders of magnitude upon changing from ion to cluster ion bombardment. Copyright © 2010 John Wiley & Sons, Ltd.