Premium
Differentiation of 18 O‐ and 16 O‐rich layers in anodic alumina films by glow discharge time‐of‐flight mass spectroscopy
Author(s) -
Molchan I. S.,
Thompson G. E.,
Skeldon P.,
Trigoulet N.,
Tempez A.,
Chapon P.,
Tuccitto N.,
Licciardello A.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3227
Subject(s) - analytical chemistry (journal) , anodizing , glow discharge , aluminium , chemistry , mass spectrometry , secondary ion mass spectrometry , nuclear reaction analysis , anode , isotope , spectroscopy , ion , plasma , electrode , physics , organic chemistry , chromatography , quantum mechanics
The performance of glow discharge time‐of‐flight mass spectrometry in isotopic differentiation is revealed using the distribution of oxygen isotopes 16 O and 18 O in barrier‐type anodic alumina films as a focus. Anodic alumina films comprising 18 O‐rich layers of controlled thickness were formed by the appropriate combination of anodising of superpure aluminium in electrolytes enriched with 18 O isotopes and of natural abundance of 18 O isotopes. Analysis of the elemental depth profiles of selected ionic species, i.e. 16 O 18 O, allowed determination of the locations of the 18 O‐rich layers and the 18 O/ 16 O interface. Copyright © 2010 John Wiley & Sons, Ltd.