Differentiation of  18 O‐ and  16 O‐rich layers in anodic alumina films by glow discharge time‐of‐flight mass spectroscopy | Zendy

Molchan I. S. | Zendy; Thompson G. E. | Zendy; Skeldon P. | Zendy; Trigoulet N. | Zendy; Tempez A. | Zendy; Chapon P. | Zendy; Tuccitto N. | Zendy; Licciardello A. | Zendy

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Differentiation of 18 O‐ and 16 O‐rich layers in anodic alumina films by glow discharge time‐of‐flight mass spectroscopy

Author(s) -

Molchan I. S.,

Thompson G. E.,

Skeldon P.,

Trigoulet N.,

Tempez A.,

Chapon P.,

Tuccitto N.,

Licciardello A.

Publication year - 2010

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.3227

Subject(s) - analytical chemistry (journal) , anodizing , glow discharge , aluminium , chemistry , mass spectrometry , secondary ion mass spectrometry , nuclear reaction analysis , anode , isotope , spectroscopy , ion , plasma , electrode , physics , organic chemistry , chromatography , quantum mechanics

The performance of glow discharge time‐of‐flight mass spectrometry in isotopic differentiation is revealed using the distribution of oxygen isotopes 16 O and 18 O in barrier‐type anodic alumina films as a focus. Anodic alumina films comprising 18 O‐rich layers of controlled thickness were formed by the appropriate combination of anodising of superpure aluminium in electrolytes enriched with 18 O isotopes and of natural abundance of 18 O isotopes. Analysis of the elemental depth profiles of selected ionic species, i.e. 16 O 18 O, allowed determination of the locations of the 18 O‐rich layers and the 18 O/ 16 O interface. Copyright © 2010 John Wiley & Sons, Ltd.

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