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Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study
Author(s) -
Preda I.,
Soriano L.,
Alvarez L.,
Méndez J.,
Yubero F.,
Gutiérrez A.,
Sanz J. M.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3222
Subject(s) - non blocking i/o , highly oriented pyrolytic graphite , pyrolytic carbon , atomic force microscopy , graphite , conductive atomic force microscopy , morphology (biology) , materials science , nanostructure , nanotechnology , chemical engineering , microscopy , crystallography , chemistry , composite material , physics , pyrolysis , optics , catalysis , organic chemistry , biology , engineering , genetics
We studied the morphology of the deposits of NiO grown on highly ordered pyrolytic graphite (HOPG), by means of inelastic peak shape analysis and atomic force microscopy. The results obtained by both techniques show an excellent agreement. The results indicate that NiO grows on HOPG by following the Stransky–Krastanov type of growth. Copyright © 2010 John Wiley & Sons, Ltd.