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Mechanisms of metal‐assisted secondary ion mass spectrometry: a mixed theoretical and experimental study
Author(s) -
Restrepo O.,
Prabhakaran A.,
Hamraoui K.,
Wehbe N.,
Yunus S.,
Bertrand P.,
Delcorte A.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3203
Subject(s) - metal , yield (engineering) , projectile , polymer , sputtering , chemistry , secondary ion mass spectrometry , ion , metal ions in aqueous solution , mass spectrometry , molecular dynamics , analytical chemistry (journal) , chemical physics , materials science , nanotechnology , computational chemistry , composite material , thin film , environmental chemistry , metallurgy , organic chemistry , chromatography
This article compares the experimental results obtained in metal‐assisted secondary ion mass spectrometry of polymers, with molecular dynamics simulations involving hybrid metal–organic surfaces. The theoretical sputtering yields are in agreement with the trends highlighted in recent experiments, in which different projectiles (Ga + , C $_{60}^{+}$ ) were used to bombard pristine and Au‐covered polymer samples. In the experiments, the link between the organic ion yield enhancement/decrease and the fraction of the surface covered by the metal is clearly established. On the other hand, the simulations show that the position of the impact point on the metal‐covered surface critically influences the calculated yields of metal and organic material, in a manner that depends on the projectile. The discussion analyzes the information obtained from the simulations and the experiments to propose a mechanism of yield enhancement. Copyright © 2010 John Wiley & Sons, Ltd.