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Detection of exogenous contaminants of fingerprints using ToF‐SIMS
Author(s) -
Szynkowska M. I.,
Czerski K.,
Rogowski J.,
Paryjczak T.,
Parczewski A.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3193
Subject(s) - chemistry , arsenic , contamination , biology , organic chemistry , ecology
The aim of this study is to present an application of ToF‐SIMS in forensic research, especially in the imaging of fingerprints and detection of traces of various substances, which do not exist in natural skin excretion, but can be connected with a crime scene. Exemplary ToF‐SIMS images of fingerprints from fingers contaminated with traces of different substances (arsenic, nickel, gunshot residues, amphetamine drugs, etc.) using three kinds of bases (aluminum, stainless steel and brass) are showed. The results of the study show the potential of ToF‐SIMS technique in the analysis of fingerprints with a view to use in forensic science. Copyright © 2010 John Wiley & Sons, Ltd.