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Error minimization in the envelope method for the determination of optical constants of a thin film
Author(s) -
Kar Meenakshi
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3188
Subject(s) - envelope (radar) , refractive index , molar absorptivity , minification , wavelength , interference (communication) , optics , thin film , function (biology) , materials science , constant (computer programming) , analytical chemistry (journal) , chemistry , mathematics , physics , computer science , nanotechnology , mathematical optimization , telecommunications , chromatography , radar , channel (broadcasting) , evolutionary biology , biology , programming language
The algorithm for the determination of optical constants of a weakly absorbing thin film from the envelope method has been modified to minimize the error in the estimated values of extinction coefficient ( k ) as a function of wavelength. The refinement procedure is based on an extension of interference order adjustment method used for improving the estimated values of film thickness d and wavelength‐dependent refractive index n from the envelope method. The proposed modification when applied to a hypothetical as well as an experimental film is found to work well over a wide spectral region. Copyright © 2010 John Wiley & Sons, Ltd.