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Influence of current density on the distribution of tungsten tracer in porous anodic alumina films
Author(s) -
Zhou F.,
LeClere D. J.,
GarciaVergara S. J.,
Skeldon P.,
Thompson G. E.,
Habazaki H.
Publication year - 2010
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3179
Subject(s) - tungsten , anodizing , materials science , porosity , tracer , transmission electron microscopy , scanning electron microscope , anode , chemical engineering , nanotechnology , chemistry , composite material , metallurgy , aluminium , electrode , physics , nuclear physics , engineering
Porous anodic alumina films have been much studied recently due to interest in the application of the self‐ordered porosity in nanotechnological systems. Experimental investigations have identified anodising regimes that generate pores with a relatively high degree of long‐range order. However, the growth mechanism of the films, and its relation to the ordering of pores, is only partially understood. In the present work, the growth processes are studied over a range of current densities for films formed in oxalic acid. The films are formed on sputtering‐deposited substrates containing tungsten nanolayers that provide W 6+ tracer species in the films. The distributions of tracer species are observed by scanning and transmission electron microscopes and the amounts of tracer species quantified by Rutherford backscattering spectroscopy. It is shown that the tungsten tracer remains within an inner region of the cells, with a tungsten‐free region being present next to the pore walls during the growth of the anodic films. Further, the thickness of the anodic film relative to that of oxidised metal increases with increasing current density, which is associated with an increase in the efficiency of film formation. This behaviour is consistent with the formation of pores by flow of film material in the barrier layer to the pore wall regions. Copyright © 2010 John Wiley & Sons, Ltd.