Determination of the optical constants of solar‐control amorphous silicon thin films on float glass | Zendy

Liu Yong | Zendy; Ni Lihong | Zendy; Liu Jun Bo | Zendy; Liu Qiying | Zendy; Song Chenlu | Zendy; Han Gaorong | Zendy

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Determination of the optical constants of solar‐control amorphous silicon thin films on float glass

Author(s) -

Liu Yong,

Ni Lihong,

Liu Jun Bo,

Liu Qiying,

Song Chenlu,

Han Gaorong

Publication year - 2009

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.3064

Subject(s) - float glass , refractive index , molar absorptivity , thin film , materials science , amorphous solid , amorphous silicon , annealing (glass) , optics , range (aeronautics) , analytical chemistry (journal) , spectral line , silicon , reflectivity , crystalline silicon , optoelectronics , composite material , chemistry , nanotechnology , physics , crystallography , chromatography , astronomy

An improved method employing a modified Forouhi and Bloomer disperse model with a hybridized simulated annealing algorithm is implemented in this paper, allowing the determination of refractive index, extinction coefficient, and thickness of a ‐Si films at one time by fitting reflectance and transmitted spectra. The thickness of films obtained by this method has a reasonable agreement with the result by ellipsometric measurement, especially for samples with thickness in the range of 40–80 nm. The presented method exhibits low time consumption and cost, which implies a possibility of usage in real‐time on‐line measurement of solar‐control coatings on float glass. Copyright © 2009 John Wiley & Sons, Ltd.

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