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Correlating data from multiple surface‐specific techniques using multivariate methods: examples and considerations
Author(s) -
Lloyd K.G.,
Walls D.J.,
Wyre J.P.
Publication year - 2009
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.3034
Subject(s) - multivariate statistics , x ray photoelectron spectroscopy , analytical chemistry (journal) , principal component analysis , raman spectroscopy , resolution (logic) , crystallinity , multivariate analysis , partial least squares regression , chemistry , materials science , computer science , statistics , mathematics , optics , crystallography , physics , artificial intelligence , nuclear magnetic resonance , chromatography
Abstract This paper presents examples of spectral and mapping data correlation among different techniques using multivariate analytical methods. Specifically, ToF‐SIMS, ATR‐IR, and XPS Valence Band spectroscopic data acquired from a three‐component polymer blend are correlated using PLS (Partial Least Squares) analysis to show the combined response to compositional changes. Raman and secondary ion mapping data from a fluorocarbon–silicone polymer blend are correlated using MCR (Multivariate Curve Resolution) to try to associate changes in crystallinity with secondary ion patterns. Finally, XPS and ToF‐SIMS mapping data are correlated using MCR to show the advantages of combining data from a higher lateral resolution technique with data from a lower lateral resolution technique. Copyright © 2009 John Wiley & Sons, Ltd.