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Changes of surface chemical structure and composition of phenolphthalein poly(ether sulfone) in different radiations
Author(s) -
Pei Xianqiang,
Sun Xiaojun,
Wang Qihua
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2928
Subject(s) - polymer , phenolphthalein , irradiation , x ray photoelectron spectroscopy , chemistry , sulfone , ether , chemical composition , oxygen , chemical structure , polymer chemistry , fourier transform infrared spectroscopy , photochemistry , materials science , chemical engineering , organic chemistry , physics , nuclear physics , engineering
To understand the different action mechanisms of space irradiation on polymers, phenolphthalein poly(ether sulfone) (PES‐C) blocks were irradiated by electrons and atomic oxygen. The changes in surface chemical structure and composition of PES‐C in different radiations were studied by attenuated total‐reflection FTIR (FTIR‐ATR) and XPS. It was found that PES‐C was prone to be influenced by space irradiation. Electron and atomic oxygen irradiation can destroy the molecular chain of PES‐C and result in changes of surface chemical composition of the polymer. But due to the different nature of the radiation sources, electron irradiation induced the carbonization of the polymer surface, while atomic oxygen irradiation resulted in the oxidation of the polymer surface. Besides this, the sulfone structure was reduced or oxidized depending on the nature of the radiation sources. So, different radiation sources might influence the surface chemical structure and composition of polymers differently. Copyright © 2008 John Wiley & Sons, Ltd.