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Development of an automated in situ fracture stage for a ToF‐SIMS system
Author(s) -
Wood Arran R.,
Benedetto Nicolas,
Hooker Nigel,
Scullion Edward,
Smith Paul A.,
Watts John F.
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2893
Subject(s) - in situ , fracture (geology) , stage (stratigraphy) , analytical chemistry (journal) , x ray photoelectron spectroscopy , composite material , secondary ion mass spectrometry , materials science , mass spectrometry , chemistry , chemical engineering , engineering , geology , chromatography , paleontology , organic chemistry
The design philosophy and implementation of an ultra high vacuum (UHV), PC controlled, automated in situ fracture stage for a surface analysis system is described. ToF‐SIMS spectra are shown to illustrate the improvement in spectral quality obtained from micro‐compact tension (CT) tests of polymer matrix fracture surfaces produced using the fracture stage in UHV compared to those obtained from a sample tested at air. This system is flexible in that by changing the capacity of the load cell it is possible to reduce or increase maximum loads as the specimen type and material demands. The stage has been designed with instrumental flexibility in mind, utilising commercial SEM‐stub type sample mounts, and can thus be used for AES/SAM and XPS investigations, as well as ToF‐SIMS analysis, in the authors' laboratory. Copyright © 2008 John Wiley & Sons, Ltd.