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ToF‐SIMS study of 1‐dodecanethiol adsorption on Au, Ag, Cu and Pt surfaces
Author(s) -
Laiho Taina,
Leiro Jarkko A.
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2722
Subject(s) - platinum , chemistry , secondary ion mass spectrometry , copper , adsorption , analytical chemistry (journal) , static secondary ion mass spectrometry , substrate (aquarium) , transition metal , metal , ion , mass spectrum , mass spectrometry , molecule , organic chemistry , catalysis , chromatography , oceanography , geology
Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used to perform a chemical analysis of long‐chain thiol (CH 3 (CH 2 ) 11 SH)‐treated gold, silver, copper and platinum surfaces. All the mass peaks from positive and negative ion spectra within the range m / z = 0–2000 u are studied. ToF‐SIMS data revealed that on gold, silver and copper substrates 1‐dodecanethiol form dense standing‐up phases, but on platinum being a catalytically active substrate, we were able to identify also surface‐aligned parallel lying molecules in addition to a standing thiolate layer. Our study shows that when ToF‐SIMS spectra are analyzed, not only the existence of oligomers but also metal + hydrocarbon fragments give information about the order of SAM. Copyright © 2008 John Wiley & Sons, Ltd.