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What can Raman spectroscopy and spectroscopic ellipsometry bring for the characterisation of thin films and materials surface?
Author(s) -
Lewandowska Renata,
Gaillet Mélanie,
Le Bourdon Gwénaëlle,
Eypert Céline,
Morel Sophie,
Naudin Coralie,
Stchakovsky Michel
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2703
Subject(s) - raman spectroscopy , ellipsometry , thin film , materials science , analytical chemistry (journal) , nanotechnology , optics , chemistry , physics , organic chemistry
Ellipsometry and Raman spectroscopy offer a wide range of applications for the characterisation of thin films, material surfaces and interfaces. Both analytical methods are non‐contact, non‐destructive and do not require any sample preparation. Firstly, theoretical basics of both techniques will be presented, and then some examples will be described. Copyright © 2008 John Wiley & Sons, Ltd.