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XPS characterization of PTFE after treatment with RF oxygen and nitrogen plasma
Author(s) -
Vesel Alenka,
Mozetic Miran,
Zalar Anton
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2691
Subject(s) - x ray photoelectron spectroscopy , oxygen , nitrogen , polytetrafluoroethylene , chemistry , foil method , plasma , surface modification , analytical chemistry (journal) , materials science , chemical engineering , composite material , chromatography , organic chemistry , physics , quantum mechanics , engineering
Abstract A study on surface modification of extended PTFE (polytetrafluoroethylene) foil after treatment in oxygen and nitrogen plasma is presented. PTFE was exposed to a weakly ionized, highly dissociated RF plasma with a high density of neutral atoms. The gas pressure was 75 Pa and the discharge power was 200 W. The appearance of the functional groups on the sample surface was determined by using high‐resolution XPS. The results showed that oxygen plasma treatment did not cause any noticeable changes in the surface composition, while after nitrogen plasma treatment new functional groups were detected on the surface. Copyright © 2008 John Wiley & Sons, Ltd.