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Study of formation and thermal stability of the Fe/ZnO(000‐1) interface
Author(s) -
Demund A.,
Wett D.,
Szargan R.
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2665
Subject(s) - x ray photoelectron spectroscopy , annealing (glass) , iron oxide , thermal stability , oxide , metal , oxidation state , chemistry , diffraction , low energy electron diffraction , analytical chemistry (journal) , materials science , electron diffraction , chemical engineering , metallurgy , organic chemistry , optics , physics , chromatography , engineering
Formation and thermal stability of the Fe/ZnO(000‐1) interface have been studied by means of X‐ray photoelectron spectroscopy and low energy electron diffraction. The results indicated a pseudo 2D growth mode for iron on ZnO. In addition, it could be shown that under ultra high vacuum conditions deposited Fe 0 on a ZnO(000‐1) single crystal was partially oxidized by a small fraction of residual OH‐groups and ZnO to FeO. A strong temperature dependence of the interface reactivity was found upon annealing at temperatures up to 600 °C. Starting from 200 °C iron was first oxidized to bivalent iron oxide. After complete oxidation of Fe 0 to Fe 2+ at 375 °C, Fe 2+ reacted to Fe 3+ . Above temperatures of 500 °C the deposited metallic iron was completely oxidized to trivalent iron. Further experiments with FeO on ZnO showed the oxidation state and the oxide film thickness of the deposited iron to be mainly dependent on the annealing temperature. Copyright © 2008 John Wiley & Sons, Ltd.