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Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres
Author(s) -
Suzuki Shigeru,
Yamamoto Takamichi,
Shinoda Kozo,
Sato Shigeo
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2635
Subject(s) - partial pressure , annealing (glass) , x ray photoelectron spectroscopy , oxygen , oxide , analytical chemistry (journal) , materials science , aluminium , secondary ion mass spectrometry , chemistry , metallurgy , chemical engineering , mass spectrometry , chromatography , organic chemistry , engineering
XPS and SIMS were used for characterizing the surface oxide layers formed on FeAl alloys during annealing under atmospheres with different partial pressures of oxygen, which were controlled by H 2 O/H 2 ratios in the gas. The XPS results showed that an aluminum oxide (Al 2 O 3 ) layer was formed on the surfaces of samples annealed at a high temperature under a low partial pressure of oxygen, while such a layer was not formed on the surfaces of samples annealed under a high partial pressure of oxygen. SIMS depth profiles showed that the surfaces of samples annealed at high temperatures under a low partial pressure of oxygen were covered with a thin Al 2 O 3 layer of approximately 50 nm thickness. It was also shown that oxygen penetrated the samples annealed under a high partial pressure of oxygen, and the depth profile of oxygen was correlated with that of aluminum. This indicates that internal oxidation of aluminum occurs in the samples annealed under a high partial pressure of oxygen. Grazing‐incidence X‐ray diffraction (GIXD) was also employed for analyzing the structure of the Al 2 O 3 layer formed on the surface of samples annealed under a low partial pressure of oxygen. Copyright © 2008 John Wiley & Sons, Ltd.