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A resonant photoelectron spectroscopy study of Sn(O x ) doped CeO 2 catalysts
Author(s) -
Matolín V.,
Cabala M.,
Cháb V.,
Matolínová I.,
Prince K. C.,
Škoda M.,
Šutara F.,
Skála T.,
Veltruská K.
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2625
Subject(s) - x ray photoelectron spectroscopy , cerium oxide , cerium , catalysis , tin oxide , oxide , doping , tin , ion , materials science , inorganic chemistry , analytical chemistry (journal) , chemistry , nuclear magnetic resonance , metallurgy , physics , biochemistry , optoelectronics , organic chemistry , chromatography
The interaction of tin with cerium oxide thin film and cerium oxide nanosized powder was studied using XPS and resonant photoelectron spectroscopy (RPES) in the Ce 4d–4f photoabsorption region. A strong tin–ceria interaction led to partial Ce 4+ → Ce 3+ transition and Sn + ion formation. A corresponding increase of the Ce 4f state occupancy was observed as a giant 4f resonance enhancement. In the case of powder catalyst a strong CeO 2 Sn interaction lead to formation of CeSnO mixed oxide system characterized by Ce 3+ ion concentration enhancement and increase of Ce 4f occupation. It explains generally higher catalytic activity of the CeSnO mixed oxide catalysts when comparing with the individual oxides. Copyright © 2008 John Wiley & Sons, Ltd.