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Comparison between XPS‐ and FTIR‐analysis of plasma‐treated polypropylene film surfaces
Author(s) -
Morent R.,
De Geyter N.,
Leys C.,
Gengembre L.,
Payen E.
Publication year - 2008
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2619
Subject(s) - x ray photoelectron spectroscopy , fourier transform infrared spectroscopy , attenuated total reflection , dielectric barrier discharge , contact angle , polypropylene , polymer , derivatization , analytical chemistry (journal) , materials science , infrared , chemistry , surface modification , chemical engineering , dielectric , chromatography , mass spectrometry , composite material , optics , physics , optoelectronics , engineering
Plasma treatment is often used to modify the surface properties of polymer films, since it offers numerous advantages over the conventional surface modification techniques. In this paper, a polypropylene (PP) film is plasma‐treated using a dielectric barrier discharge (DBD) operating in air at medium pressure (5.0 kPa). The modified polymer films are characterized using contact angle measurements, XPS‐analysis and attenuated total reflectance‐Fourier transform infrared (ATR‐FTIR) spectroscopy. Results show that plasma treatment leads to a remarkable decrease in contact angle owing to the implantation of oxygen‐containing functional groups. Using XPS and ATR‐FTIR, these oxygen‐containing groups can be identified as CO, CO and OCO. In this paper, it is also shown that XPS is well‐suited to provide quantitative chemical analysis of the PP films, while ATR‐FTIR can only give qualitative information. To perform quantitative ATR‐FTIR measurements, chemical derivatization will be explored in the near future. Copyright © 2008 John Wiley & Sons, Ltd.