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Study of the end‐group contribution to ToF‐SIMS and G‐SIMS spectra of poly (lactic acid) using deuterium labelling
Author(s) -
Ogaki R.,
Green F. M.,
Gilmore I. S.,
Shard A. G.,
Luk S.,
Alexander M. R.,
Davies M. C.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2600
Subject(s) - chemistry , deuterium , secondary ion mass spectrometry , ion , lactic acid , analytical chemistry (journal) , mass spectrometry , mass spectrum , labelling , hydrogen–deuterium exchange , static secondary ion mass spectrometry , end group , chromatography , organic chemistry , polymer , biochemistry , physics , quantum mechanics , biology , bacteria , copolymer , genetics
In this study, polymeric (MW 50 000) and oligomeric (MW 2000) poly (lactic acid) (PLA), both with and without end‐group deuterium exchange, were analysed using static secondary ion mass spectrometry (SSIMS) to investigate the contribution of end‐group‐derived secondary ions to the SSIMS spectra. By monitoring the SSIMS intensities between the non‐deuterated and deuterated PLA, it is evident that the only significant end‐group‐derived secondary ions are [ n M + H] + ( n > 1) and C 4 H 9 O 2 + . The gentle‐SIMS (G‐SIMS) methodology was employed to establish that deuterated fragments were produced through low energy processes and were not the result of substantial rearrangements. It was noted that end‐group‐derived secondary ions had higher G‐SIMS intensities for oligomeric PLA than polymeric PLA, showing that these secondary ions are simple fragment products that are not the result of rearrangement or degraded product ions. Copyright © 2007 John Wiley & Sons, Ltd.