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An approach to differentiating between multi‐ and monolayers using MALDI‐TOF MS
Author(s) -
Quiñones Rosalynn,
Raman Aparna,
Gawalt Ellen S.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2561
Subject(s) - monolayer , alkyl , x ray photoelectron spectroscopy , self assembled monolayer , contact angle , molecule , thin film , chemistry , materials science , titanium oxide , metal , titanium , nanotechnology , chemical engineering , organic chemistry , composite material , engineering
Analysis and confirmation of monolayer film thickness on metal oxide surfaces has proven to be challenging. XPS and AFM have been used to investigate the monolayer formation. However, these techniques are difficult to access and/or determine the composition of the organic molecules on the surfaces. Here we demonstrate the ability of MALDI‐TOF to characterize long alkyl chain phosphonic acid molecules in thin films on titanium, iron and stainless steel. These systems are known to be stable, strongly adhered films. The thin films were characterized by IR, AFM, contact angle measurements and the results were confirmed by MALDI‐TOF. Moreover, the MALDI‐TOF was used to differentiate between mono‐ and multilayers on planar surfaces. Copyright © 2007 John Wiley & Sons, Ltd.