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Summary of ISO/TC201 standard: ISO/TR 18394:2006—surface chemical analysis—Auger electron spectroscopy—derivation of chemical information
Author(s) -
Kövér L.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2552
Subject(s) - auger electron spectroscopy , auger , electron spectroscopy , chemical state , chemistry , analytical chemistry (journal) , auger effect , spectral line , x ray photoelectron spectroscopy , spectroscopy , core electron , electron , atomic physics , atom (system on chip) , chemical composition , characterization (materials science) , materials science , nuclear magnetic resonance , nanotechnology , physics , organic chemistry , astronomy , quantum mechanics , nuclear physics , computer science , embedded system
ISO/TR 18394 provides guidance for the identification of chemical effects on x‐ray or electron‐excited Auger electron spectra as well as for applications of these effects in chemical characterization of surface/interface layers of solids. In addition to elemental composition, information can be obtained on the chemical state and the surrounding local electronic structure of the atom with the initial core hole from the changes of Auger electron spectra upon the alteration of its local environment. The methods of identification and use of chemical effects on Auger electron spectra, as described in this Technical Report, are very important for accurate quantitative applications of Auger electron spectroscopy. Copyright © 2007 John Wiley & Sons, Ltd.