Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra | Zendy

Hesse R. | Zendy; Streubel P. | Zendy; Szargan R. | Zendy

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Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra

Author(s) -

Hesse R.,

Streubel P.,

Szargan R.

Publication year - 2007

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.2527

Subject(s) - voigt profile , convolution (computer science) , gaussian , spectral line , product (mathematics) , gaussian function , function (biology) , x ray photoelectron spectroscopy , mathematics , mathematical analysis , chemistry , physics , nuclear magnetic resonance , computational chemistry , quantum mechanics , computer science , geometry , machine learning , evolutionary biology , biology , artificial neural network

A comparative study for the fitting of X‐ray photoelectron spectra (XPS) using different model functions is presented. Synthetically generated test spectra using Gaussian/Lorentzian convolution and a real measured spectrum are fitted with the three commonly used models: product, sum and Gaussian/Lorentzian convolution functions. In these limited tests, it was found that the sum function is superior to the product function, particularly for low‐noise spectra. Copyright © 2007 John Wiley & Sons, Ltd.

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