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Atomic force microscopy imaging of ZnO nanodots deposited on quartz by sparking off different tip shapes
Author(s) -
Kumpika T.,
Thongsuwan W.,
Singjai P.
Publication year - 2007
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/sia.2507
Subject(s) - nanodot , raman spectroscopy , quartz , nucleation , atomic force microscopy , annealing (glass) , materials science , conical surface , microscopy , nanotechnology , spectroscopy , analytical chemistry (journal) , optoelectronics , optics , chemistry , composite material , physics , organic chemistry , chromatography , quantum mechanics
We have demonstrated a simple method for depositing ZnO nanodots on quartz substrates by sparking off different tip shapes at voltages of 2, 4 and 6 kV in air at atmospheric pressure. A comparison was made among the three tip shapes: the sharp tip, the conical tip and the dull tip. The surface morphology was then observed by atomic force microscopy. The mean height of the randomly distributed dots of approximately 8 nm was successfully deposited from the sharp tip at 6 kV. Characterizations by UV–vis spectroscopy and Raman spectroscopy have confirmed the presence of ZnO and the quality improvement by annealing treatments. Moreover, a nucleation mechanism of the nanodot formation is discussed. Copyright © 2006 John Wiley & Sons, Ltd.