Atomic force microscopy imaging of ZnO nanodots deposited on quartz by sparking off different tip shapes | Zendy

Kumpika T. | Zendy; Thongsuwan W. | Zendy; Singjai P. | Zendy

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Atomic force microscopy imaging of ZnO nanodots deposited on quartz by sparking off different tip shapes

Author(s) -

Kumpika T.,

Thongsuwan W.,

Singjai P.

Publication year - 2007

Publication title -

surface and interface analysis

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.52

H-Index - 90

eISSN - 1096-9918

pISSN - 0142-2421

DOI - 10.1002/sia.2507

Subject(s) - nanodot , raman spectroscopy , quartz , nucleation , atomic force microscopy , annealing (glass) , materials science , conical surface , microscopy , nanotechnology , spectroscopy , analytical chemistry (journal) , optoelectronics , optics , chemistry , composite material , physics , organic chemistry , chromatography , quantum mechanics

We have demonstrated a simple method for depositing ZnO nanodots on quartz substrates by sparking off different tip shapes at voltages of 2, 4 and 6 kV in air at atmospheric pressure. A comparison was made among the three tip shapes: the sharp tip, the conical tip and the dull tip. The surface morphology was then observed by atomic force microscopy. The mean height of the randomly distributed dots of approximately 8 nm was successfully deposited from the sharp tip at 6 kV. Characterizations by UV–vis spectroscopy and Raman spectroscopy have confirmed the presence of ZnO and the quality improvement by annealing treatments. Moreover, a nucleation mechanism of the nanodot formation is discussed. Copyright © 2006 John Wiley & Sons, Ltd.

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